![]() ![]() XRD has been designed, built, and continues to operate through a partnership with IBM. Users are encouraged to discuss potential samples with the instruments scientists very early in the planning process. This results in a small region to mount the sample, making the mounting of large samples and some sample environments challenging. Potential users should note that the instrument was designed with center of the "chi" circle aligned to the axis of rotation rather than offset. The instrument features point, strip, and area detectors. The high energy beam (4.5 keV to 23 keV) is combined with a six-circle Ψ goniometer for measurement of thin films as well as single and polycrystalline materials. At the Beamline for Material Measurement, XRD features a tunable, monochromatic, high intensity beam with a beam spot on the order of 100 micrometers. The X-ray diffraction (XRD) end station measures constructive interference of the x-ray wave with repeating atomic and interfacial structure in materials.
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